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5 – 6 August 2009
Kompleks Pusat Pengajian Jejawi 3, Arau The School of Environmental Engineering (PPKAS), Universiti Malaysia Perlis (UniMAP) is pleased to announce the Short Course on XRF Spectroscopy and Material Characterization to be held on 5 – 6 August 2009. The 2-day short course is a joint collaboration with Fluxana GmbH & Co. KG (Fluxana) and DKSH Technology Sdn Bhd (DKSH Technology). Fluxana is the manufacturer of various scientific and analytical instruments in Germany while DKSH Technology is the sole distributor of analytical instruments for Fluxana in Malaysia.
INTRODUCTION
X-ray fluorescence spectroscopy (XRF) is a non-destructive analytical technique used to identify and determine the concentrations of elements present in solid, powdered and liquid samples. XRF is capable of measuring elements from Beryllium (Be) to Uranium (U), and beyond at trace levels and up to 100%. The XRF spectrometer measures the individual component wavelengths of the fluorescent emission produced by a sample when irradiated with X-rays. GENERAL OUTLINE
The Short Course on XRF Spectroscopy and Material Characterization is organized with the aim to give exposure on the potential of XRF techniques in testing and characterization methods. Participants will be exposed on X-ray principles, XRF applications including analysis of materials using XRF. Beside that, techniques and main considerations in XRF samples preparation will also be demonstrated by the expert from Fluxana itself. During the short course ample opportunities will be provided to the participants to observe a variety of samples preparation either in solid, powder or liquid forms. At the end of the short course, the methods of analysis and demonstration of samples preparation would aid the participants to obtain more convincing and reliable testing results. PARTICIPATION - Engineers and managers in material-related industry
- Academics (University, Polytechnique etc)
- Researchers at research organizations
- Laboratory and unit coordinators
- Postgraduate students(Masters and PhD)
The closing date for submitting application is 24 July 2009 Participants are welcomed to bring along one own sample for ED-XRF analysis. Analysis of results will be sent later if it can not be ready during the course. COURSE CONTENT
Day 1 (5/8/2009) – Presentation - Introduction to XRF
- XRF sample preparation technique
- Sample preparation, crushing, milling
- Application for liquids
- Application for solids
- Fusion technique
- XRF sample preparation using Fusion
- PANalytical range of XRF (WDXRF & EDXRF)
Day 2 (6/8/2009) – Workshop - Sample preparation using milling machine, fusion machine and analysis by ED-XRF PANanalytical MiniPAL 4.
JOINT-ORGANIZERS 
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| | Fluxana GmbH & Co. KG | DKSH Technology Sdn Bhd |
SPEAKER’S PROFILE
Konstantin Brendgens started with Thyssen Krupp Steel in 2001, and graduated as a Chemielaborant in 2004. Completed his study in chemistry from the university in Dortmund and started to work for FLUXANA in 2008 as a customer support doing technical service. FLUXANA is the leader in X-ray fluorescent analysis, sample preparation equipment and accessories, and also consumables. It application areas include laboratory equipment and requirements, and other related service for laboratories. COURSE FEES & PAYMENT
A registration fee of RM 180.00 per person (RM 100.00 for students) includes lunch and seminar kits. Payments can be made by cash during registration or by cheques, postal orders or money orders payable to “Bendahari UniMAP” and must be addressed to Pusat Pengajian Kejuruteraan Alam Sekitar, Universiti Malaysia Perlis. For further information, please contact: Secretariat of Short Course on
XRF Spectroscopy and Material Characterization
Attn: Ms Nabilah Aminah (012-364 9306) / Mr Mohd Rozaimi (019-272 2021)
Tel No.: 04-979 8626
Fax: 04-979 8636
E-mail:
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